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服务器硬盘ahci,HP MicroServer Gen8 盘位1 AHCI模式认不到 4T硬盘

[[email protected] ~]# smartctl --all /dev/sdb

smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.0-514.26.2.el7.x86_64] (local build)

Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===

Device Model:     HGST HUS726040ALE610

Serial Number:    NHGJH7PY

LU WWN Device Id: 5 000cca 243c77f2d

Firmware Version: APGNT907

User Capacity:    4,000,787,030,016 bytes [4.00 TB]

Sector Sizes:     512 bytes logical, 4096 bytes physical

Rotation Rate:    7200 rpm

Device is:        Not in smartctl database [for details use: -P showall]

ATA Version is:   ACS-2, ATA8-ACS T13/1699-D revision 4

SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)

Local Time is:    Tue Jul 18 09:10:28 2017 CST

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status:  (0x82)        Offline data collection activity

was completed without error.

Auto Offline Data Collection: Enabled.

Self-test execution status:      (   0)        The previous self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection:                 (  113) seconds.

Offline data collection

capabilities:                          (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities:            (0x0003)        Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability:        (0x01)        Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time:          (   2) minutes.

Extended self-test routine

recommended polling time:          ( 571) minutes.

SCT capabilities:                (0x003d)        SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       -       0

2 Throughput_Performance  0x0005   135   135   054    Pre-fail  Offline      -       112

3 Spin_Up_Time            0x0007   144   144   024    Pre-fail  Always       -       455 (Average 458)

4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       44

5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0

7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0

8 Seek_Time_Performance   0x0005   128   128   020    Pre-fail  Offline      -       18

9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       3083

10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0

12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       44

192 Power-Off_Retract_Count 0x0032   096   096   000    Old_age   Always       -       5786

193 Load_Cycle_Count        0x0012   096   096   000    Old_age   Always       -       5786

194 Temperature_Celsius     0x0002   136   136   000    Old_age   Always       -       44 (Min/Max 19/51)

196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0

197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0

198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0

199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1

No Errors Logged

SMART Self-test log structure revision number 1

No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS

1        0        0  Not_testing

2        0        0  Not_testing

3        0        0  Not_testing

4        0        0  Not_testing

5        0        0  Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

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